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Details for article 971 of 6539 found articles
| Title: |
Defect and interface analyses of non-stoichiometric n-type GaSb thin films grown on Ge(100) substrates by rapid thermal annealing |
| Author: |
Nishimoto, Naoki Fujihara, Junko Yoshino, Katsumi |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 537 (2018) nr. C pages 349-354 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 971 of 6539 found articles
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